F.Novak, N.Sutanovac, R.Trobec.
Built-in self testing of communications systems using ASIC technology.
Microprocessors and Microsystems, 17(8):475-480, 1993.
Built-in self-test is a functional requirement that a complex
electronic system must satisfy in order to provide efficient
production testing and system maintenance. Effective solutions
with minimum possible hardware overhead are needed.
By the advent of application specific integrated circuits,
integration of functions conventionally performed by external test
instrumentation in a single test IC on a board has become a reality.
The paper gives an example how the advantage of user programmable logic
was taken in the design of a built-in self-test of an asynchronous
time division multiplex unit, supporting both second-order and
third-order multiplex equipment, as recommended by the CCITT.
(reprints available on request)