Marina Santo-Zarnik, Franc Novak, Srecko Macek.
Design for test of crystal oscillators,
JOURNAL OF ELECTRONIC TESTING: Theory and Applications, Vol. 11, No. 2, 1997, pp. 109-118.
A feasibility study of design-for-testability (DFT) of a voltage controlled
crystal oscillator with built-in MOS switches to increase its observability
and controllability is presented. The primary aim was to assess to what
extent the operation of the circuit is changed when the switches are
introduced. The possibility of non-destructive
localization of faulty components in the provided test modes and the
temperature/frequency characteristics measurements are
Finally, on the basis of the presented experimental work,
a design-for-test procedure for crystal oscillator circuits is
The work was performed in a development phase of a voltage controlled
temperature compensated crystal oscillator.
(reprints available on request)