F. Novak, M. Santo Zarnik, U. Kac.
Stimulus generation of a built-in-self-test using oscillation based test structures.
International Journal of Electronics, Vol. 89, No. 11, 2002, pp. 811-820.

An oscillation based test method is a simple and in some cases quite efficient method for production go no-go test. In this approach, the circuit is transformed into an oscillator during the test mode and the frequency of oscillation is measured and compared to a reference value obtained on a known-good circuit operating in the same conditions. The main drawback is that only some parts of a complex analogue system can be transformed into oscillators and hence be tested by the oscillation test approach. In this paper, we extend their application to stimulus generation of a built-in self-test. Oscillation test structures of switched-capacitor and active RC filters are considered. Simple ways of changing the oscillation frequency are discussed.