F. Novak and M. Santo Zarnik.
Thermal testing using oscillation based test structures.
Electronics Letters, Vol. 39, No. 2, 2003, pp. 174-175.

With slight modification, the oscillation based test structures originally implemented for a go-no go test can also be used for thermal testing. The idea is described in a case study of the low-pass Sallen and Key filter and the Notch filter. The approach can be generalized to the oscillation based test structures of other types of analogue circuits.

(reprints available on request)