U. Kac, F. Novak, F. Azais, P. Nouet, M. Renovell.
Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test.
IEEE Design & Test of Computers, Vol. 20, No. 2, 2003, pp. 32-39.

Some practical limitations in the conventional IEEE 1149.4 mixed-signal test can be overcome by the proposed extensions of the analog boundary module. The modified ABM structure facilitates analog internal test procedures and provides multiple voltage comparator levels, increasing the diagnostic resolution of interconnect test.