G. Papa, T. Garbolino, F. Novak, A. Hlawiczka.
Deterministic test pattern generator design with genetic algorithm approach.
Journal of Electrical Engineering, 2007, Vol. 58, No. 3, 2007, pp. 121-127.
The paper presents an automatic technique for structure optimization of a deterministic test pattern generator (TPG).
The TPG is composed of a linear register and a non-linear combinational function that can invert any bit in the generated
patterns. Consequently, any arbitrary test sequence can be produced. This kind of a TPG is suitable for on-line built-in
self-test (BIST) implementations where a set of deterministic test patterns is required. In order to reduce the gate count
of the BIST structure a genetic algorithm (GA) is employed. In contrast to conventional approaches, a GA concurrently
optimizes multiple parameters that influence the final solution. Experimental results on ISCAS benchmarks demonstrate the
efficiency of the approach.