F. Novak et al.
Academic network for microelectronic test education.
International Journal on Engineering Education, Vol. 23, No. 6, 2007, pp. 1245-1253.
This paper is an overview of the activities performed in the framework of the European IST project EuNICE-Test
(European Network for Initial and Continuing Education in VLSI/SOC Testing using remote automatic test
equipment (ATE)), addressing the shortage of skills in the microelectronics industry in the field of
electronic test. The project was based on the experience of common test resource centre (CRTC) for
French universities. In the framework of EuNICE-Test project, the existing network expanded to 4 new
academic centres: Universitat Polit?cnica de Catalunya, Spain, Politecnico di Torino, Italy, University
Stuttgart, Germany and Jožef Stefan Institute Ljubljana, Slovenia. Assessments of the results achieved
are presented as well as course topics and possible future extensions.