U. Legat, A. Biasizzo, F. Novak.
SEU recovery mechanism for SRAM-based FPGAs.
IEEE Transactions on Nuclear Science, vol. 59, no. 5, 2012, pp. 2562-2571.
The application of SRAM-based field-programmable
gate arrays (FPGAs) in mission-critical systems requires errormitigation
and recovery techniques to protect them from the errors
caused by high-energy radiation, also known as single event
upsets (SEUs). For this, modular redundancy and runtime partial
reconfiguration are commonly employed techniques. However, the
reported solutions feature different tradeoffs in the area overhead
and the fault latency. In this paper,we propose a lowarea-overhead
SEU recovery mechanism and describe its application in different
self-recoverable architectures, which are experimentally evaluated
using a specially designed fault-emulation environment. The environment
enables the user to inject faults at selected locations of the
configuration memory and experimentally evaluate the reliability
of the developed solutions.