Marina Santo - Zarnik, Franc Novak, Srecko Macek
A practical approach to fault localization in crystal oscillators,
Proc. of IEEE European Test Workshop, Montpellier, France, June 12-14, 1996, pp.89-93.
This paper reports on practical experience in non-destructive fault localization in crystal oscillators implemented in SMD technology. An approach to a fast verification of the operation of a crystal in a given oscillator circuit for the specified temperature range is described. It complements our earlier work on fault localization in oscillator circuits designed for testability by MOS switches. Experimental results in fault localization of a prototype series of the oscillator circuits are presented to illustrate the approach.