Experimental test infrastructure supporting IEEE 1149.4 standard,
Proc. 7th IEEE European Test Workshop , pp. 211-212, Corfu, Greece, May 26-29, 2002.
The paper reports recent results in the design and applications of an IEEE 1149.4 test chip
with extended ABM functionality. The work is performed by LIRMM and JSI in the frame of bilateral
french-slovenian PROTEUS project. The first version prototype series of the test chip is currently
in fabrication. It will enable us to evaluate the functionality of the analog and the digital part
of the design before we integrate them in the second Dot 4 chip version. Besides, the prototype will
be used for the development of enhanced measurement procedures including modified internal test
and interconnection test.