All-pass SC biquand reconfiguration scheme for oscillation based analog BIST,
Proc. 9th IEEE European Test Symposium, ETS 2004, pp. 133-138, Ajaccio, France, May 23-26, 2004.
In this work, a test reconfiguration scheme for switched-capacitor stages featuring biquadratic transfer
functions with finite complex zeros is presented. The proposed approach allows to perform the
oscillation-based test of relevant biquad parameters without the need for complex stimulus generation
or analog output processing and requires low analog area overhead. The scheme is especially suitable
for implementing low-cost analog BIST of SC filter cores embedded within complex mixed-signal devices.